Improving Fault Localization by Complex-Fault Oriented Higher-Order Mutant Generation
Zexing Chang, Yong Liu, Shumei Wu, Paul Doyle, Haifeng Wang, Xiang Chen · 2023
Fault Localization (FL) is one of the most essential and time-consuming steps during software debugging. Mutation-based fault localization (MBFL) is one FL technique that has demonstrated promising fault localization accuracy in recent years. Current MBFL techniques mainly use First-Order Mutant (FOM) to localize faults, and only perform well in simple fault localization. When facing complex fault localization, MBFL with FOMs can only achieve low FL accuracy. Moreover, previous Higher-Order Mutant (HOM) generation techniques only use simple combinations of FOMs but do not consider the correlation between simple faults in the composition of complex faults. In this study, we consider the relationships between single faults and propose SFClu, a novel HOM generation method. Specifically, SFClu aims to generate HOMs to simulate complex faults consisting of multiple unrelated simple faults on multiple lines. To evaluate the performance of our proposed methods, we conduct empirical studies on 237 complex-fault programs from two datasets. The experimental results show that SFClu significantly outperforms traditional HOM generation methods (i.e., Last2First, DifferentOperators, and RandomMix). Furthermore, the experimental results also demonstrate that Higher-Order MBFL(HMBFL) with SFClu can outperform the state-of-the-art SBFL and MBFL techniques in terms of EXAM, TOP-N, and MAP metrics.