Workload-Aware Periodic Interconnect BIST
Somayeh Sadeghi-Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich · IEEE Design and Test · 2023
Editor’s notes: This article investigates periodic built-in self-test (BIST) solutions to counter crosstalk and electromigration threats endangering interconnect reliability in safety-critical systems. — Mehdi B. Tahoori, Karlsruhe Institute of Technology, Germany