Deep Learning-Based Self-Admitted Technical Debt Detection Empirical Research
Yubin Qu, Tie Bao Yubin Qu, Meng Yuan Tie Bao, Long Li Meng Yuan · 網際網路技術學刊 · 2023
Self-Admitted Technical Debt (SATD) is a workaround for current gains and subsequent software quality in software comments. Some studies have been conducted using NLP-based techniques or CNN-based classifiers. However, there exists a class imbalance problem in different software projects since the software code comments with SATD features are significantly less than those without Non-SATD. Therefore, to design a classification model with the ability of dealing with this class imbalance problem is necessary for SATD detection. We propose an improved loss function based on information entropy. Our proposed function is studied in a variety of application scenarios. Empirical research on 10 JAVA software projects is conducted to show the competitiveness of our new approach. We find our proposed approach can perform significantly better than state-of-the-art baselines.