Improved Fault Detection of Analog Circuits by utilizing the Fundamental RMS of the Supply Current Fluctuation
Vassilios D. Vassios, Argyrios T. Hatzopoulos, Dimitrios K. Papakostas · 2023
In this paper, an improved method for Fault Detection of analog circuits is presented. The improved method relies on measuring the Power Supply Current when the Circuit Under Test is put under a under/overvoltage stress and the power supply current (IPS) is measured. These measurements are used to extract new metrics for the normal and faulty behavior of the Circuit Under Test. Both Mean and fundamental RMS Supply Current are calculated to extract the signatures for the under/overshooting of the Power Supply current and the relaxation time that is needed for the circuits to return to their normal, nominal operation. The fundamental RMS value is used. The improved algorithm is presented, including simulation and actual results, for the algorithm, which is tested on analog circuits, showing the improved results against older approaches.