Machine Learning–Based VLSI Test and Verification
Jyoti Kandpal · 2023
To test Integrated Chips, test pattern generation and fault simulation are vital. Testing verifies a circuit's accuracy regarding gates and connections between them. The fundamental purpose of testing is to model the circuit's various activities. Several Electronic Design Automation tools for fault identification and test pattern development are available to simulate circuits for structural testing. This chapter gives a brief idea of machine learning techniques: defect identification and test pattern generation at various abstraction levels.