ANALYSIS OF ERRORS OF OPTOELECTRONIC MOISTURE METERS
Abdusamat Karimov, Mukhammadziyo Ismanov · Zenodo (CERN European Organization for Nuclear Research) · 2023
The variety of existing measurement schemes puts the issue of choosing the optimal measurement scheme and optimal parameters of metrological indicators according to their structure (random and systematic errors) to the fore. It should be noted that most moisture meters are built according to the Lagorfmic scheme.