Gate-Level Side-Channel Leakage Ranking With Architecture Correlation Analysis
Pantea Kiaei, Yuan Yao, Zhenyuan Liu, Nicole Fern, Cees-Bart Breunesse, Jasper van Woudenberg, Kate Gillis, Alex Dich, Peter J. Grossmann, Patrick R. Schaumont · IEEE Transactions on Emerging Topics in Computing · 2023
While side-channel leakage is traditionally evaluated from a fabricated chip, it is more time-efficient and cost-effective to do so during the design phase of the chip. We present a methodology to rank the gates of a design according to their contribution to the side-channel leakage of the chip. The methodology relies on logic synthesis, logic simulation, gate-level power estimation, and gate leakage assessment to compute a ranking. The ranking metric can be defined as a specific test by correlating gate-level activity with a leakage model, or else as a non-specific test by evaluating gate-level activity in response to distinct test vector groups. Our results show that only a minority of the gates in a design contribute most of the side-channel leakage. We demonstrate this property for several designs, including a hardware AES coprocessor and a cryptographic hardware/software interface in a five-stage pipelined RISC processor.