Design and Implementation of an Automatic Test and Verification System for SoC
Lijun wang, Xiaolu Liu · Journal of Physics Conference Series · 2023
Abstract With the development of semiconductor technology in recent years, the design of SoC has become more and more complex. [1]In order to ensure the correctness of chip design and the success rate of chip taping out, the verification test of SoC becomes more and more important. This paper designs an automated test and verification system based on STM32 and analog switch matrix chips. The system has high reusability, good scalability, convenient maintenance and automated test, and can improve the efficiency of test and verification, reduce the cost and shorten the development cycle of SoC.