Toward a metrology-information layer for digital systems
Mark Kuster · ACTA IMEKO · 2023
Recent work has proposed a metrology-information layer (M-Layer) to support digital systems with quantities and units by addressing the difficulties conventional quantity-unit systems pose for digitalization. This paper reports work toward developing the M-Layer’s current abstract conceptualization into a concrete model, working prototype, and demonstration software, with the eventual goal to create a FAIR (findable, accessible, interoperable, reusable) resource.