The Method of Processing Abnormal Values for Flight Test Data Based on Wavelet Transform
Jingxiang Xu, Lei Zuo, Zheng Zhao · 2022
In the flight test data, there usually are abnormal values due to uncertainties in acquisition, storage and transmission. Processing the abnormal values is essential to ensure the accuracy of subsequent test data analysis. In this paper, we propose an abnormal value processing method based on wavelet transform for flight test data. We use the summation of high- frequency wavelet details as the characteristic quantity for abnormal value detection. Moreover, the detection threshold is constructed based on the idea of constant false alarm detection to locate and process the abnormal values. Simulation results show that the method can detect and process the abnormal values in the time-series flight test data fast and accurately.