Adaptive Granularity On-die ECC
Daero Kim, Jung Rae Kim · 2022 19th International SoC Design Conference (ISOCC) · 2022
DRAM vendors have introduced on-die ECC (Error Correction Codes) to protect memory from errors. The current on-die ECC provides weak Single Error Correction (SEC) protection, yet growing errors demand stronger protection. This paper proposes a novel memory protection scheme called Adaptive Granularity On-die ECC (AGO-ECC). AGO-ECC adjusts access granularity and ECC protection strength based on memory locality and reliability requirements. For critical or high-locality data, AGO-ECC increases the granularity and applies Triple Error Correction (TEC). AGO-ECC can improve not only reliability but also performance.