Fault Resilience Techniques for Flash Memory of DNN Accelerators
Shyue-Kung Lu, Yu‐Sheng Wu, Jinhua Hong, Kohei Miyase · 2022
Deep neural networks (DNNs) are being widely used in smart appliances, face recognition and autonomous driving. The trained weight data are usually stored in flash memory which suffers from reliability and endurance issues. Owing to the inherent error tolerability for DNN applications, address remapping techniques are proposed for protecting weight data stored in flash memory. Bit significances are first analyzed and then a weight transposer is proposed for remapping significant weight bits to fault-free or much reliable flash cells. A bipartite graph model is developed for modeling address remapping. The corresponding hardware architectures for address remapping are also proposed. We use the deep learning framework pytorch for evaluating inference accuracy for different DNN models. Experimental results show that based on 0.01 % injected BER in the weight data, the accuracy losses of widely used DNN models are less than 1 % with negligible hardware overhead.