Using Fault Detection Tests to Produce Diagnostic Tests Targeting Large Sets of Candidate Faults
Hari Addepalli, Irith Pomeranz, Enamul Amyeen, Suriyaprakash Natarajan, Arani Sinha, Srikanth Venkataraman · 2022
A logic diagnosis procedure produces a set of can-didate faults that are expected to identify the defects present in a faulty chip. To reduce the number of candidates produced, diagnostic tests are often needed. The use of diagnostic tests increases the storage requirements of a test set. Earlier works reduced the input storage requirements of a fault detection test set by using each stored test to apply several different tests. When applied to diagnostic tests, the tests were selected by performing diagnostic fault simulation of a basic fault model. In this paper, we apply this approach to target large sets of candidate faults produced by a logic diagnosis tool. A procedure for the selection of a subset of the available tests to be used as diagnostic tests is described. Experimental results for simulated defects in benchmark circuits and the logic blocks of an OpenSPARC T1 microprocessor show that the diagnostic test set selected using our approach produces better diagnosis results, with a minimal increase in input storage, compared to a diagnostic test set produced by a commercial tool.