Design of self-testing RAMs
Vyacheslav N. Yarmolik, G.-R. Memetov, M. Nicolaidis · HAL (Le Centre pour la Communication Scientifique Directe) · 1995
RAMs built in complex VLSIs are frequently used at present. Self-testing is the most appropriate testing method for these devices. RAM testing should be as complete as possible because RAM is one of the major parts in any computer system. In this work we propose a self-testing RAM design that allows detection of all faults of given types. As a result, a self-testing RAM with 100-% detectability of certain faults was designed.