Environments for Independent Testing and IV&V on Large IoT Systems
Jon Duncan Hagar · Apress eBooks · 2022
The previous two chapters addressed the test SIL, environments, and tools. Large IoT systems may be composed of multiple IoT devices, edges, layers, and central processing. I have mentioned the issue of ownership of such large IoT systems. There may be many vendors of IoT devices, different stakeholder organizations looking to be using the IoT system, and no clear-cut “owner” of testing the whole system. In this chapter, I offer advice on using test independence and IV&V to support such large IoT systems. This chapter will interest procuring stakeholders, as they recognize the need for test ownership of the system or system-of-systems.