An Impact of Aging on Arbiter Physical Unclonable Functions
Kurra Anil Kumar, Rani Nelakuditi · Apple Academic Press eBooks · 2022
On chip physical unclonable functions (PUFs) are emerged to be one of the lightweight security primitives in hardware cryptography to solve several security problems. It can generate a random set of responses for each challenge by utilizing the inherent process variations during manufacturing process. The extracted responses from each PUF should be die specific and acts like a device fingerprint. Hence, it is difficult to clone or counterfeit the similar kind PUF architecture. It is well known that the responses obtained from each PUF can be utilized for the different kinds of cryptographic applications, including IP protection, device authentication, RFID detection/identification, IoT security, etc. The performance of PUF architectures is estimated by using the metrics like uniqueness, reliability, and randomness. A PUF should be robust against temporal variations in circuits and the effect of temporal changes in circuits are influences the reliability. Out of the several factors, aging is one of the major and critical factors which flip the PUF response. In practice, it is essential to identify the major factors responsible for aging such as bias temperature instability (BTI), hot carrier injection (HCI), time-dependent dielectric breakdown (TDDB), electromigration, etc. This chapter mainly addresses the impact of aging on strong PUFs and estimated the aging phenomenon on MUX-decoder PUF architecture by applying statistical analysis using cadence virtuoso 45 nm CMOS technology.