Class-wise Thresholding for Robust Out-of-Distribution Detection
Matteo Guarrera, Baihong Jin, Tung-Wei Lin, María Alejandra Zuluaga, Yuxin Chen, Alberto Luigi Sangiovanni-Vincentelli · 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) · 2022
We consider the problem of detecting Out-of-Distribution (OoD) input data when using deep neural networks, and we propose a simple yet effective way to improve the robustness of several popular OoD detection methods against label shift. Our work is motivated by the observation that most existing OoD detection algorithms consider all training/test data as a whole, regardless of which class entry each input activates (inter-class differences). Through extensive experimentation, we have found that such practice leads to a detector whose performance is sensitive and vulnerable to label shift. To address this issue, we propose a class-wise thresholding scheme that can apply to most existing OoD detection algorithms and can maintain similar OoD detection performance even in the presence of label shift in the test distribution.