Runway Image Recognition Technology based on Line Feature
Le Zhang, Jinsong Wang, Zhiyong An, Yuhang Shang · 2022 IEEE 2nd International Conference on Electronic Technology, Communication and Information (ICETCI) · 2022
Aiming at the accuracy of identifying enemy airports and attacking their key runways in military, the runway image recognition technology is studied. Firstly, the runway features in the image are analyzed in an all-round way, and an airport image recognition method based on Hough algorithm is proposed. Secondly, the runway model is established and the runway features are extracted according to the runway gray, spacing, width, length and crossing degree. According to the runway features, the runway edge is recognized, and then the runway is recognized. Simulation results show that this method can effectively identify the target image with runway characteristics.