An Automotive ASIL-D Safety Mechanism in ADC and DAC for Communication Application
Kyung-Hoon Lee, Jinwoo Park, Younghyo Park, Byeongwoo Koo, Sunghan Do, Woongtaek Lim, Sungno Lee, Hyochul Shin, Eunhye Oh, Young‐Jae Cho, Michael Jin Choi, Jongshin Shin · 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 2022
This paper presents the highest automotive safety integrity level (ASIL-D) certified safety mechanism in analog-to-digital converter (ADC) and digital-to-analog converter (DAC) for communication application. The safety mechanism with built-in-self-test (BIST) monitors 3 safety items in real time and checks periodically 15 safety items of mixed-signal functionality. The ADC and DAC embedded with safety mechanisms are the first published converter IPs achieving ASIL-D certification, which show the highest fault coverage compared with previously published ASIL IPs/Chips.