On Backside Probing Techniques and Their Emerging Security Threats
Liton Kumar Biswas, Leonidas Lavdas, Mir Tanjidur Rahman, Mark Mohammad Tehranipoor, Navid Asadizanjani · IEEE Design and Test · 2022
Various probing methodologies have been developed in the semiconductor industry to perform failure analysis of an integrated circuit. However, these probing techniques can be misused to launch security attacks and extract sensitive information from the hardware. In this article, the authors provide an overview of such attacks and present probable countermeasures and their limitations.