A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage
Gyohun Jeong, Sangmin Kim, Hyelyun Kim, Sung-Hee Lee · 2022
In this paper, we propose a TC clustering method that simultaneously considers two data groups: the I/O workload and the function coverage for a higher level of firmware testing. Subsequently, we introduce an application model that predicts the function coverage using only the I/O workload of the TCs from the above method.