Front cover: An efficient built‐in error detection methodology with fast page‐oriented data comparison in 3D NAND flash memories
HM. Cao, F. Liu, Qingzhe Wang, ZC. Du, L. Jin, ZL. Huo · Electronics Letters · 2022
The cover image is based on the Original Article An efficient built-in error detection methodology with fast page-oriented data comparison in 3D NAND flash memories by Zongliang Huo et al., https://doi.org/10.1049/ell2.12484.