PVT Tolerant Zero Bit-Error-Rate Physical Unclonable Function Exploiting Hot Carrier Injection Aging in 7nm FinFET Technology
Jyothi Velamala, Siang-jhih Sean Wu, Padma Penmatsa, Kuan-Yueh James Shen, David Johnston, Rachael J. Parker · 2022 IEEE Custom Integrated Circuits Conference (CICC) · 2022
Integrated circuit security applications often require a unique ID on each die that can be read reliably over the lifetime of the product [1]. Physical Unclonable Functions (PUFs) are low-cost cryptographic primitives used to generate unique, stable, and secure IDs for device authentication and secure communication [2] [3]. PUFs rely on random process variations inherent in the manufacturing flow making it impossible to predict, or clone chip IDs, providing a high level of security and tamper resistance [1]. 1kb PUF arrays are fabricated in Intel's 7nm FinFET technology featuring (i) a hybrid-SRAM based PUF [1] [2] and (ii) a new NFET only PUF with a novel stress operation exploiting Hot Carrier Injection (HCI).