A Novel Method for Detecting Parametric Faults in Analog Circuits using Fuzzy Logic
S. Karthi, K. Kavitha, Dinesh Kumar J. R.* · International Journal of Innovative Technology and Exploring Engineering · 2020
The demand for testability analysis of analog circuits has been increased in recent years. The fault detection and fault classification method is important in detecting the parametric faults of the circuit. In this paper, Simulation Before Test (SBT) is considered as a basic mechanism for detecting the parametric faults.. The circuit Under Test (CUT) used is Sallen-Key bandpass filter. Transfer function of the CUT is used for fault detection by locating the poles and Zeros of the transfer function. Fuzzy logic is used for fault classification.