Robust test generation algorithm for stuck-open fault in CMOS circuits
Mao Weiwei, Ling Xieting · 1986
A test generation algorithm for stuck-open faults in CMOS combinational circuits is presented in the paper. A two pattern test, e.g., an initializing input pattern T1 and a test input pattern T2 can be generated at the same time. It is shown that the test {T1,T2} generated using the algorithm is a robust test.