Proceedings. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
2003
The following topics are dealt with: yield and defects; optoelectronics; fault analysis, injection and simulation; test and diagnosis; current test and diagnosis; test generation and application; scan design and test; BIST; error correcting codes; analogue and mixed signal test; defect tolerance and testing; FPGA and memory test; design verification and synthesis; SoC and core test; system reliability; fault tolerance; soft errors.