Automatic partitioning for deterministic test
D. Crestani, A. Aguila, M.K. Gentil, P. Chardon, C. Durante · Proceedings EURO-DAC '92: European Design Automation Conference · 2003
Automatic partitioning for digital circuits is proposed. The partitions are defined by using functional testability measures and a test difficulty estimation. The software, developed with an expert system generator, is embedded in a hierarchical test generation process. The partitioning technique proposed uses difficulty test estimation corresponding to the maximal number of logical gates that can be embedded in a given partition. This parameter represents the maximal number of gates that can be handled by the tool.>