CATAPULT: concurrent automatic testing allowing parallelization and using limited topology
Rhonda Kay Gaede, M. Ray Mercer, Kenneth M. Butler, Don E. Ross · 2003
An improved algorithm is presented for identifying redundant faults and finding tests for hard faults in combination circuits. A concurrent approach is proposed which is based on the concepts of functional decomposition, explicit representation of fanout stems, and the Boolean difference. The data structure used is the binary decision diagram. The algorithm operates as a back end to test generators which use random patterns or heuristics or a combination of the two.>