Efficient SAT-based Dynamic Compaction and Relaxation for Longest Sensitizable Paths
Matthias Sauer, Sven Reimer, Tobias Schubert, Ilia Polian, Bernd Becker · 2013
Comprehensive coverage of small-delay faults under massive process variations is achieved when multiple paths through the fault locations are sensitized by the test pair set. Using one test pair per path may lead to impractical test set sizes and test application times due to the large number of near-critical paths in state-of-the-art circuits.