From memory device cross section to data integrity figures of space mass memories
Dietmar Walter, M. Herrmann, K. Griirmann, F. Gliem · 2013
The influence of SEU and SEFI events in 4-Gbit DDR3 SDRAM on the data integrity of an example mass memory with a capacity of 4-Tbit and Single Symbol Error Correcting Reed-Solomon Code is investigated.