Proceedings. 24th IEEE VLSI Test Symposium
2006
The following topics are dealt with: delay testing; high speed interconnect test; reliability screening methods for high-performance processors; test quality; scan compression; IP protection; flash and memory testing; nanometer IC testing; yield analysis; low power applications; FPGA embedded instrumentation; ATPG; test generation and test flow; IDDQ, MEMS and wireless testing; silicon on chip; RF testing; transistor level diagnosis; analog test; nanoscale testing; scan based diagnosis; and mixed signal test.