M-LINE THE MOST ADVANCED INSTRUMENTATION FOR ELECTRONIC PROCESS CONTROL
Chemical & Engineering News · 1962
RETURN TO ISSUEAdvertisementNEXTM-LINE THE MOST ADVANCED INSTRUMENTATION FOR ELECTRONIC PROCESS CONTROLCite this: Chem. Eng. News 1962, 40, 8, 3Publication Date (Print):February 19, 1962Publication History Published online6 November 2010Published inissue 19 February 1962https://doi.org/10.1021/cen-v040n008.p002Copyright © 1962 AMERICAN CHEMICAL SOCIETYArticle Views56Altmetric-Citations-LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InReddit PDF (920 KB) SUBJECTS:Process control Get e-Alerts