Ripeness sensor development
Purdue Univ., Lafayette, IN (United States). Dept. of Agricultural Engineering · 1992
About 20--25% of the total production of fruits and vegetables in the USA must be discarded after harvest About 25--30% of this loss is the result of over-ripening and this loss represents about 8.39 [times] 10[sup 12] BTU of invested energy every year. This invested energy could be saved by non-destructive ripeness sensing. Sweetness is an important indicator of fruit quality and highly correlated with ripeness in most fruits. Research to develop a non-destructive fruit ripeness sensor has been conducted in the Agricultural Engineering Department at Purdue University. It is based on [sup 1]H-MR (proton Magnetic Resonance). A first generation prototype of the ripeness sensor based on [sup 1]H-MR was built and tested with. Results show that the sensor can discriminate small fruit (0.75 in diameter or smaller) differing in sugar content by 6%. This prototype can separate the fruit into at least two groups: one ripe and the other not ripe. The estimated cost for such a ripeness sensor is around $4,000. The signal sensitivity of the prototype can be improved to enable it to differentiate between fruits varying in sugar content by only 1 or 2% by using water peak suppression techniques to recover relatively weak sugar resonance signals in intact fruits, modifying circuits to eliminate noise, leakage and distortion of input/output signals, improving the magnetic console to get a higher magnetic field and better homogeneity, and designing a probe to achieve a higher signal-to-noise (S/N) ratio. As research continues a second generation ripeness sensor will be developed which will incorporate many of the improvements and which will be suitable for commercial use. Additional research will allow application of the technique to a wider range of fruit sizes (from blueberries to watermelons). This report describes estimated energy savings, feasibility studies, development of the initial prototype, and preliminary evaluation of the first generation prototype.