Some relationships between delay testing and stuck-open testing in CMOS circuits
R. David, S. Rahal, J.-L. Rainard · Proceedings of the European Design Automation Conference, 1990., EDAC. · 2002
Various kinds of faults must be tested in CMOS circuits. Testing of an excessive delay as well as testing of a stuck-open fault requires a sequence of two successive input vectors. It has been observed by many authors that there are some similarities between delay testing and stuck-open testing. In this paper it is shown that if all the delay faults have been robustly tested in a combinational circuit, then all the stuck-open faults have been robustly tested too.>