Reliability Analysis Reloaded: How Will We Survive?
R. John Aitken, Görschwin Fey, Zbigniew Kalbarczyk, Frank Reichenbach, Matteo Sonza Reorda · 2013
In safety related applications and in products with long lifetimes reliability is a must. Moreover, facing future technology nodes of integrated circuit device level reliability may decrease, i.e., counter-measures have to be taken to ensure product level reliability. But assessing the reliability of a large system is not a trivial task. This paper revisits the state-of-the-art in reliability evaluation starting from the physical device level, to the software system level, all the way up to the product level. Relevant standards and future trends are discussed.