A statistical model to locate faults at input level
Ji Wu, Jia Xiao-xia, Chang Liu, Yang Hai-yan, Chao Liu, Jin Mao-zhong · 2004
We present a statistical model to locate faults at the input level based on the failure patterns and the success patterns. The model neither needs to be fed with software module, code or trace information, nor does it require re-executing the program. To evaluate the model, precision and recall are adopted as the criteria. Five programs are examined and 17 testing experiments are conducted in which the model gains 0.803 in precision and 0.697 in recall on average.