Fault detection and automated fault diagnosis for embedded integrated electrical passives
Hee-Byung Yoon, Junwei Hou, Anirban Chatterjee, M. Swaminathan · 2002
In this paper, we propose a novel test technique for fault detection and automated fault diagnosis using pole/zero analysis of embedded integrated passive. For pole/zero analysis, an ensemble of circuits obtained by perturbing the circuit under test parameters using their known statistical distributions is generated. The poles and zeros of every circuit in this ensemble are extracted. From knowledge of the passive circuit specifications, pass and fail regions for the critical poles and zeros are computed in the real-imaginary plane. The proposed test technique uses a region-matching algorithm to detect faults and perform automated diagnosis of catastrophic and parametric faults using frequency domain 2-port measurements.