Diagnosing realistic bridging faults with single stuck-at information
D.B. Lavo, Brian Chess, Tracy Larrabee, F. Joel Ferguson · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1998
Successful failure analysis requires accurate fault diagnosis. This paper presents a method for diagnosing bridging faults that improves on previous methods. The new method uses single stuck-at fault signatures, produces accurate and precise diagnoses, and takes into account imperfect fault modeling; it accomplishes this by introducing the concepts of match restriction, match requirement, and match ranking.