On the application of formal fault localization to automated RTL-to-TLM fault correspondence analysis for fast and accurate VP-based error effect simulation - a case study
Vladimir Herdt, Hoang M. Le, Daniel J. Grosse, Rolf Drechsler · 2016
Electronic systems integrate an increasingly large number of components on a single chip. This leads to increased risk of faults, e.g. due to radiation, aging etc. Such a fault can lead to an observable error and failure of the system. Therefore, an error effect simulation is important to ensure the robustness and safety of these systems. Error effect simulation with Virtual Prototypes (VPs) is much faster than with RTL designs due to less modeling details at TLM. However, for the same reason, the simulation results with VP might be significantly less accurate compared to RTL. To improve the quality of a TLM error effect simulation, a fault correspondence analysis between both abstraction levels is required. This paper presents a case study on applying fault localization methods based on symbolic simulation to identify corresponding TLM errors for transient bit flips at RTL. First results for the interrupt controller of the SoCRocket VP, which is being used by the European Space Agency, demonstrate the applicability of our approach.