Accurate QBF-based Test Pattern Generation in Presence of Unknown Values
Stefan Hillebrecht, Michael A. Kochte, Dominik Erb, Hans-Joachim Wunderlich, Bernd Becker · 2013
Unknown (X) values may emerge during the design process as well as during system operation and test application. Sources of X-values are for example black boxes, clock-domain boundaries, analog-to-digital converters, or uncontrolled or uninitialized sequential elements.