Proceedings International Test Conference 2008
2008
The following topics are dealt with: system-level microprocessor online test; embedded memory diagnosis and characterization; high-speed I/O testing; defect avoidance in microprocessors; cost analysis framework-for-multicore systems; delay testing; chip performance maximization; power-aware DFT methods; board interconnect test technology; complex SOCs reliability; power supply noise analysis; ATE instrumentation design; small-delay fault ATPG embedded memory test; RF testing; test standards; data converter testing; advanced industrial practices; and analog test technology.