Small-area fault clusters and fault tolerance in VLSI circuits
Charles H. Stapper · IBM Journal of Research and Development · 1989
In previous treatments of the manufacturing yield of fault-tolerant integrated-circuit chips, fault clusters were either assumed to be absent or relatively large in area. Presented here is a treatment in which the occurrence of small-area fault clusters is assumed. Four different types of statistical distributions are considered, and a criterion is described for determining whether small-area fault clusters are present.