Using the Allan variance and power spectral density to characterize dc nanovoltmeters
Th. J. Witt · 2002
Stochastic serial correlations in nanovoltmeter data are often ignored and the experimental standard deviation divided by the square root of the number of observations is incorrectly used to describe the scatter. This paper demonstrates the use of power spectra and the Allan variance to characterize the performance of digital and analog DC nanovoltmeters.