iFill: An Impact-Oriented X-Filling Method for Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing
Jia Li, Qiang Xu, Yu Hu, Xiaowei Li · 2008 Design, Automation and Test in Europe · 2008
In scan-based tests, power consumptions in both shift and capture phases may be significantly higher than that in normal mode, which threatens circuits' reliability during manufacturing test. In this paper, by analyzing the impact of X-bits on circuit switching activities, we present an X-filling technique that can decrease both shift- and capture-power to guarantees the reliability of scan tests, called iFill. Moreover, different from prior work on X-filling for shift-power reduction which can only reduce shift-in power, iFill is able to decrease power consumptions during both shift-in and shift-out. Experimental results on ISCAS' 89 benchmark circuits show the effectiveness of the proposed technique.