Special session 8C: E.J. McCluskey doctoral thesis award semi-final
Michele Portolan, K. Huang · 2015
Named after Prof. E.J. McCluskey, a key contributor to the field of test technology, the 2015 TTTC's Doctoral Thesis Award serves the purpose to i) promote the most impactful doctoral student work, ii) provide the students with the exposure to the community and the prospective employers, and iii) support interaction between academia and industry in the field of test technology. TTTC's E.J. McCluskey Best Doctoral Thesis Award will be given to the winning student of the doctoral student contest and his or her advisor. The award consists of a certificate, an honorarium and an invitation to submit a paper on the presented work to the IEEE Design & Test magazine. In this session, each contestant is given 9 minutes for presentation. After the end of all presentations, a poster session follows, Q&A from a panel of industry experts and the audience. The panel of experts will judge the presented doctoral theses with regards to theoretical advancement, industrial relevance and presentation. The grades submitted by the industrial panel will be combined with the grades given by the academic jury, consisting of distinguished professors. The winner will be announced during the VTS 2015 social event.