Test Method of Measurement of Common-Emitter DC Current Gain of Junction Transistors
F01 Committee · 1999
Scope1.1 This test method covers the measurement of common-emitter d-c current gain (forward, hFE, or inverted, hFEI) of bipolar transistors, for which the collector-emitter leakage current, ICEO, is less than 10% of the collector current, IC, at which th