Memory testing with a RISC microcontroller
Ad van de Goor, Georgi Gaydadjiev, Said Hamdioui · 2010
Many systems are based on embedded microcontrollers. Applications demand for production and Power-On testing, including memory testing. Because low-end microcontrollers may not have memory BIST, the CPU will be the only resource to perform at least the Power-On tests. This paper shows the problems, solutions and limitations of CPU-based at-speed memory testing, illustrated with examples from the ATMEL RISC microcontroller.