A New Methodology to Identify the Conducted Emission Source of Integrated Circuits
Yuanhao Li, Xie Shuguo, Zhao Chenji · 2021 13th International Symposium on Antennas, Propagation and EM Theory (ISAPE) · 2021
In this paper, we introduce a new method for identifying internal conducted emission (CE) source of Integrated Circuits (ICs). By studying the spectrum characteristics of three typical internal interference sources, sine wave, square wave and spike, and the general characteristics of the power distribution network (PDN) transfer functions of ICs, the envelope detrending method is proposed, which combines machine learning and classification algorithms to make it possible to identify the conducted emission source of ICs.