Image calibration technology for radiation hardened CMOS image processor
Sichong Huang, Tiejun Lu, Zhenlin Lu, Zizheng Yang, Zixuan Tian · 2022
Affected by the total ionizing dose, the CMOS image sensor degrades and the fixed pattern noise increases. In order to improve the removal efficiency and effect of the current fixed pattern noise, an image correction method based on statistical filtering and wavelet analysis was proposed. Firstly, the image is segmented by selective down sampling. Next, a particular shaped Gaussian filter kernel is used to blur the image. The fuzzy image and the original image are then statistical extracted and compared. Finally, after median processing, the correction result is obtained. Experimental results show that SFAWA has a better processing performance.