Automatic Test Generation for Maximal Diagnosis of Linear Analog Circuits
Salvador Mir, M. Lubaszewski, Vladimı́r Kolařı́k, Bernard Courtois · 1996
A fault-based multifrequency test generation and fault diagnosis procedureisproposed in this work. The procedure selects a minimal set of test measures and generates the minimal set of frequency tests which guarantee maximum fault coverage and maximal diagnosis of circuit AC hard#soft faults. The procedure is exempli #ed for several self-testable linear analog circuits. 1 Introduction The rapid growth in the deploymentofhybrid analog #digital circuits has strengthened the need of addressing test and diagnosis issues for analog circuits. In the digital case, test and diagnosis techniques have been successfully developed and automated. This is not yet the case for analog circuits. Analog fault diagnosis has been addressed bytwo general methods: simulate-before-test #SBT# and simulate-after-test #SAT# #1#. The former is based on the use of fault dictionaries. The latter uses measurements to compute parameters of the network or locate the faulty components. SAT approaches rely on solvi...